Investigation of the Optical, Voltage and Frequency Dependent Dielectric Properties and Conductivity Effect in Copper Oxide Nanoparticles

Ben Nasr F, Guermazi H, Leroy G, Duponchel B and Guermazi S

Published on: 2022-09-20


The optical and dielectric properties along with electric relaxation of the copper oxide nanoparticles (CuO:NPs) are studied. The band gap and free carrier's concentration to effective mass ratio of the CuO are found to be 2.12 eV, and 1.57.1049 g-1 cm-3, respectively.

The structure is investigated by means of X-ray diffraction (XRD) and MEB spectroscopy. Imaginary parts of dielectric constant, volume energy loss (VELF), surface energy loss (SELF), and optical conductivity, are studied against photon energy. Optical conductivity and energy loss functions increase with photon energy, attributed to the excitation of charge carriers by the photon energy. Dielectric study was carried out at room temperature and at different bias voltages. The behavior of the dissipation factor against frequency is in accordance with Maxwell Wagner model. The increase of dielectric losses at low frequency domain proves the contribution of the grain boundaries in conduction mechanism, in accordance with the high interface state density. Moreover, the AC conductivity of CuO obeys the Jonscher’s universal power law, and the conduction mechanism is the correlated barrier hopping.